SCANNING ELECTRON MICROSCOPE
HITACHI SCANNING ELECTRON MICROSCOPE (S-2460)
SEM is used to characterize structure by revealing grain boundaries, phase boundaries, inclusion distribution, and evidence of mechanical deformation. Scanning Electron Microscopy is also used to characterize fracture surfaces, integrated circuits, corrosion products ,and other rough surfaces, especially when elemental microanalysis of small features is desired. Scanning Electron microscopy provides better resolution (higher magnifications), greater depth of field (can image rough surfaces), qualitative elemental microanalysis.
|
